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Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron
Published on: June 9, 2016
Accurate wavelength calibration method for compact CCD spectrometer
Abstract:
Wavelength calibration is an important step in charge-coupled device (CCD) spectrometers. In this paper, an accurate calibration method is proposed. A model of a line profile spectrum is built at the beginning, followed by noise reduction, bandwidth correction, and automatic peak-seeking treatment. Experimental tests are conducted on the USB4000 spectrometer with a mercury-argon calibration light source. Compared with the traditional method, the results show that this wavelength calibration procedure obtains higher accuracy and the deviations are within 0.1 nm.
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