Ray tracing matrix approach for refractive index mismatch aberrations in confocal microscopy

The 2×2 ray tracing matrix (RTM) method is employed for the description of optical aberrations caused by the refractive index mismatch (RIM) in fluorescent confocal polarization microscopy. We predict and experimentally confirm that due to the RIM a liquid crystal layer with highly non-uniform director distribution appears to be imaged as a layer with non-uniform thickness, which shows up in the roughness of the rear surface. For the off-axial focusing of the probing beam in a droplet dispersed in an immiscible liquid, we have developed an extended method still keeping the 2×2 dimensionality of the RTM.