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High-speed scrubbing demonstration using an optically reconfigurable gate array.

Takumi Fujimori, Minoru Watanabe

    Optics Express
    |April 7, 2017
    PubMed
    Summary
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    This study proposes a high-speed scrubbing method for optically reconfigurable gate arrays (ORGAs) to combat soft-errors in configuration memories. This novel approach significantly enhances the mean time between soft-errors (MTBF) for ORGA architectures.

    Area of Science:

    • Computer Engineering
    • Radiation Effects
    • Reconfigurable Computing

    Background:

    • Field-programmable gate arrays (FPGAs) are susceptible to soft-errors in high-radiation environments, impacting configuration memory reliability.
    • Existing fault tolerance techniques like triple modular redundancy are insufficient for mitigating soft-errors in FPGA configuration memories.

    Purpose of the Study:

    • To propose and demonstrate a high-speed scrubbing method for optically reconfigurable gate array (ORGA) architectures.
    • To address the soft-error vulnerability of configuration memories in radiation-intensive applications.

    Main Methods:

    • Development of a novel high-speed scrubbing technique tailored for ORGA architectures.
    • Experimental validation of the proposed method using an ORGA-VLSI testbed.

    Related Experiment Videos

  • Theoretical analysis of the mean time between soft-errors (MTBF) for ORGA configuration memory.

    • Main Results:

    • The proposed high-speed scrubbing method effectively enhances soft-error tolerance in ORGA configuration memories.
    • Experimental results confirm the feasibility and performance of the ORGA-based scrubbing approach.
    • Theoretical analysis indicates a significant improvement in MTBF, extending it by 1.35-1.89 million times compared to current FPGAs.

    Conclusions:

    • The developed high-speed scrubbing method offers a robust solution for improving the reliability of ORGAs in high-radiation environments.
    • ORGAs present a promising architecture for achieving enhanced soft-error resilience in critical applications.
    • This research paves the way for more dependable reconfigurable computing systems in space and other radiation-exposed settings.