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One-dimensional stitching interferometry assisted by a triple-beam interferometer.
Optics Express
|April 26, 2017
Summary
We developed a triple-beam interferometer for stitching interferometry, enhancing accuracy and repeatability in surface measurements. This method reduces interferometer errors for precise optical component characterization.
Area of Science:
- Optical Engineering
- Metrology
- Surface Metrology
Background:
- Stitching interferometry is crucial for measuring large optical surfaces.
- Classical stitching methods like least-squares can be limited by accuracy and repeatability.
- Interferometer errors can propagate into the final stitched surface map.
Purpose of the Study:
- To propose a novel stitching interferometry method using a triple-beam interferometer.
- To improve the accuracy and repeatability of surface measurements compared to classical methods.
- To reduce the impact of interferometer errors on the final stitched topography.
Main Methods:
- Utilizing a triple-beam interferometer to measure distance and tilt for all sub-apertures.
- Calculating relative piston between adjacent sub-apertures using overlapping area data.
- Comparing the proposed method with the classical least-squares stitching principle.
Main Results:
- The proposed method enhances accuracy and repeatability, especially with numerous sub-aperture measurements.
- Simulations and experiments on flat and spherical mirrors confirm reduced influence of interferometer error.
- Achieved a root mean square comparison of approximately 2 nm with Fizeau interferometry data.
- Demonstrated repeatability within ± 2.5 nm peak to valley.
Conclusions:
- The triple-beam interferometer approach offers superior performance for stitching interferometry.
- This method effectively mitigates systematic errors inherent in classical stitching techniques.
- The findings are validated through simulations and experimental results on optical components.
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