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Consequences of the CMR effect on EELS in TEM

Wolfgang Wallisch1, Michael Stöger-Pollach1, Edvinas Navickas2

  • 1University Service Centre for Transmission Electron Microscopy, Technische Universitát Wien, Wiedner Hauptstraße 8-10, A-1040 Wien, Austria.

Ultramicroscopy
|April 28, 2017
PubMed

Keywords:
Band gapCMREMCDLow lossVEELS

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