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Updated: Mar 3, 2026

Electrospray Deposition of Uniform Thickness Ge23Sb7S70 and As40S60 Chalcogenide Glass Films
Published on: August 19, 2016
Structure of rare-earth chalcogenide glasses by neutron and x-ray diffraction
James W E Drewitt1, Philip S Salmon, Anita Zeidler
1Department of Physics, University of Bath, Bath BA2 7AY, United Kingdom. School of Earth Sciences, University of Bristol, Wills Memorial Building, Queen's Road, Bristol, BS8 1RJ, United Kingdom.
Abstract:
The method of neutron diffraction with isomorphic substitution was used to measure the structure of the rare-earth chalcogenide glasses [Formula: see text](Ga2 X 3)0.33(GeX 2)0.60 with [Formula: see text] or Ce and [Formula: see text] or Se. X-ray diffraction was also used to measure the structure of the sulphide glass. The results are consistent with networks that are built from GeX 4 and GaX 4 tetrahedra, and give R-S and R-Se coordination numbers of 8.0(2) and 8.5(4), respectively. The minimum nearest-neighbour R-R distance associated with rare-earth clustering is discussed.
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