New density profile reconstruction methods in X-mode reflectometry

R B Morales1, S Hacquin2, S Heuraux1

  • 1IJL, University of Lorraine, UMR 7198 CNRS, 54506 Vandoeuvre, France.

Summary

This study enhances plasma density profile reconstruction for X-mode reflectometry by introducing complex functions, improving accuracy and enabling real-time monitoring. The new method offers greater stability and efficiency for analyzing plasma dynamics.