Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Confocal Fluorescence Microscopy01:16

Confocal Fluorescence Microscopy

21.5K
Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...
21.5K
The Electrical Double Layer01:30

The Electrical Double Layer

15
In the region where two bulk phases meet, an intricate electric charge distribution arises due to charge transfer, ion adsorption, molecular orientation, and charge distortion. This complex distribution is commonly referred to as the electrical double layer.When a solid electrode interfaces with ions in an electrolyte solution, the speed of electron transfer dictates the rates of oxidation and reduction. The electrode acquires a charge through the escape of atoms into the solution as cations or...
15

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Ion-Pairing-Mediated Selective Transport of Rare Earth Elements through Functionalized Graphene Nanopores.

The journal of physical chemistry letters·2026
Same author

Effects of a spore-forming probiotic blend on bowel habits and physical well-being in adults with functional constipation: A randomized, double-blind, placebo-controlled trial.

PloS one·2026
Same author

Sputtering yield for metal halide perovskite devices patterning.

Science and technology of advanced materials·2026
Same author

Patterning of Lead Halide Perovskite Device Stacks on CMOS Readout Using Selective Microfabrication Protocols.

Advanced materials (Deerfield Beach, Fla.)·2026
Same author

Plasmonic artificial inspector for herbal medicines via surface-enhanced Raman spectroscopy and deep learning.

Scientific reports·2026
Same author

Electrochemical Control over Electron Density of InAs Quantum Dots.

Journal of the American Chemical Society·2026

Related Experiment Video

Updated: Mar 3, 2026

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
14:11

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis

Published on: March 29, 2016

27.7K

Ion beam profiling from the interaction with a freestanding 2D layer.

Ivan Shorubalko1, Kyoungjun Choi2, Michael Stiefel1

  • 1Laboratory for Reliability Science and Technology, Empa (Swiss Federal Laboratories for Materials Science and Technology), Überlandstrasse 129, CH-8600 Dübendorf, Switzerland.

Beilstein Journal of Nanotechnology
|May 3, 2017
PubMed
Summary

Focused ion beam (FIB) technology enables nanometer-scale patterning of 2D materials. This study reveals a novel method using 2D layer perforation to precisely profile ion beams, achieving resolutions beyond beam size and uncovering unique beam shapes.

Keywords:
exposure dosefocused ion beamfreestanding 2D layergrapheneion beam diameterion beam point spread function

More Related Videos

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
07:10

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry

Published on: April 29, 2020

2.1K
The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
12:14

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

Published on: August 12, 2013

22.6K

Related Experiment Videos

Last Updated: Mar 3, 2026

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
14:11

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis

Published on: March 29, 2016

27.7K
3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
07:10

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry

Published on: April 29, 2020

2.1K
The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
12:14

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

Published on: August 12, 2013

22.6K

Area of Science:

  • Materials Science
  • Nanotechnology
  • Surface Science

Background:

  • Focused ion beam (FIB) technology is crucial for nanometer-scale patterning of freestanding 2D materials.
  • Traditional methods are limited by beam diameter for patterning resolution.
  • Understanding ion beam interaction with 2D materials is key for advanced nanofabrication.

Purpose of the Study:

  • To demonstrate pattern resolution beyond the focused ion beam diameter.
  • To develop a precise method for profiling focused ion beams using 2D material perforation.
  • To investigate the influence of exposure dose on pore diameter and extract ion beam profiles.

Main Methods:

  • Utilizing focused ion beam (FIB) to perforate freestanding 2D material layers.
  • Analyzing the relationship between FIB exposure time/dose and resultant pore diameter.
  • Determining ion beam profiles by measuring pore dimensions and calculating the ion-beam point spread function.
  • Extracting graphene sputtering yield and profiling helium ion beams.

Main Results:

  • Achieved pattern resolution exceeding the focused ion beam size.
  • Demonstrated that pore diameter is dependent on FIB exposure dose, revealing beam profiles.
  • Verified Gaussian profiles for focused gallium ion beams.
  • Observed asymmetric and triangular beam shapes for helium ion beams, potentially due to trimer sources.

Conclusions:

  • The developed 2D-layer perforation method provides detailed ion beam profiling information, surpassing conventional techniques.
  • This technique offers insights into ion beam characteristics, including shape and intensity distribution.
  • The findings advance the understanding of ion-matter interactions for precise nanofabrication with FIB technology.