One-shot profile inspection for surfaces with depth, color and reflectivity discontinuities
Optics Express
|May 5, 2017
Abstract:
A one-shot technique for surfaces with depth, color, and reflectivity discontinuities is presented. It uses windowed Fourier transform to extract the fringe phases and a binary-encoded scheme to unwrap the phases. Experiments show that absolute phases could be obtained with high reliability.
More Related Videos
07:103D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
Published on: April 29, 2020
2.1K
14:11Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
Published on: March 29, 2016
27.7K
