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AFM reconstruction of complex-shaped chiral plasmonic nanostructures
A V Kondratov1, O Y Rogov1, R V Gainutdinov1
1Shubnikov Institute of Crystallography of Federal Scientific Research Centre "Crystallography and Photonics" of Russian Academy of Sciences, 119333 Moscow, Russia.
Ultramicroscopy
|May 21, 2017
Summary
Accurate shape reconstruction of plasmonic nanostructures is crucial for understanding optical metamaterials. This study presents a novel atomic force microscopy (AFM) post-processing method to enhance the analysis of periodic nanofeatures.
Area of Science:
- Materials Science
- Nanotechnology
- Optics
Background:
- Optical metamaterial phenomena are often plasmonic, necessitating precise knowledge of fabricated nanostructure shapes.
- Accurate characterization of periodic features in nanostructures is essential for understanding their optical properties.
Purpose of the Study:
- To develop and present a consistent approach for the shape reconstruction of plasmonic nanostructures.
- To improve the analysis of periodic features in complex nanostructures using atomic force microscopy (AFM).
Main Methods:
- Fabrication of specialized vertical and tilted spike AFM probes.
- High-resolution AFM imaging of plasmonic nanostructures.
- Development and application of specific post-processing algorithms for AFM data.
Main Results:
- Demonstrated a robust method for reconstructing the shape of plasmonic nanostructures.
- Successfully applied the method to a complex-shaped chiral metamaterial.
- The post-processing routine significantly enhances the characterization of periodic features.
Conclusions:
- The described post-processing routine extends the capabilities of existing deconvolution algorithms for periodic structures.
- This approach provides valuable information about periodic features, crucial for optical metamaterial research.
- The method is particularly effective for structures with known rotational symmetry.

