An open-source platform to study uniaxial stress effects on nanoscale devices

G Signorello1, M Schraff1, P Zellekens1

  • 1IBM Research-Zurich, 8803 Rüschlikon, Switzerland.

Summary

We developed an open-source platform for characterizing nanodevices under uniaxial stress using electrical and optical methods. This tool enhances the study of nanoscale materials and electronics, particularly for piezo-resistance in indium arsenide (InAs) nanowires.

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