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Updated: Feb 28, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

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Scanning tunnelling microscope light emission: Finite temperature current noise and over cut-off emission

Vijith Kalathingal1, Paul Dawson2, J Mitra3

  • 1School of Physics, Indian Institute of Science Education and Research, Thiruvananthapuram, Kerala, 695016, India. vijith@iisertvm.ac.in.

Scientific Reports
|June 16, 2017
PubMed

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