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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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High-resolution X-ray diffraction with no sample preparation.

G M Hansford1, S M R Turner1, P Degryse2

  • 1Space Research Centre, Department of Physics and Astronomy, University of Leicester, Leicester LE1 7RH, England.

Acta Crystallographica. Section A, Foundations and Advances
|June 30, 2017
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Summary
This summary is machine-generated.

Energy-dispersive X-ray diffraction (EDXRD) in back-reflection geometry offers non-destructive analysis of unprepared samples. This high-resolution technique excels in phase identification and microstructural analysis, even for rare geological and cultural heritage materials.

Keywords:
back-reflection geometrycultural heritage artefactsenergy-dispersive XRDnon-destructive analysissample preparationsynchrotron experiments

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Area of Science:

  • Crystallography
  • Materials Science
  • Geology

Background:

  • Traditional X-ray diffraction (XRD) often requires extensive sample preparation, limiting its application to delicate or rare materials.
  • High-resolution analysis is crucial for precise material characterization but can be hindered by sample positioning and morphology.
  • Energy-dispersive X-ray diffraction (EDXRD) offers an alternative approach to XRD analysis.

Purpose of the Study:

  • To evaluate the effectiveness of high-resolution back-reflection EDXRD for analyzing unprepared samples.
  • To demonstrate the technique's capabilities in phase identification, unit-cell parameter derivation, and microstructural analysis.
  • To explore the potential applications of this non-destructive method in geology, cultural heritage, and other scientific fields.

Main Methods:

  • Implementation of energy-dispersive X-ray diffraction (EDXRD) in a back-reflection geometry at the Diamond Light Source synchrotron.
  • Utilizing pre-characterized geological materials to test and refine the analytical methods.
  • Application of the technique to unprepared rock, fossil, archaeological, and cultural heritage samples.

Main Results:

  • Demonstrated extreme insensitivity to sample morphology and positioning, enabling high-quality analysis.
  • Successfully performed phase identification, derived precise unit-cell parameters, and extracted microstructural information from unprepared samples.
  • Identified a specific muscovite polytype in an unprepared mica schist sample, showcasing the technique's advantage over traditional methods.

Conclusions:

  • High-resolution back-reflection EDXRD is a powerful, non-destructive technique for analyzing unprepared geological and other materials.
  • The method has significant potential for the crystallographic analysis of cultural heritage artifacts, aiding in research and conservation.
  • The technique's ability to avoid sample extraction makes it invaluable for rare and high-value objects in various scientific disciplines.