Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

4.6K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
4.6K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Raman spectroscopy in microfluidic chips reveals hyphal scale stress-associated metabolic responses in filamentous soil fungi.

Fungal biology·2026
Same author

Potassium-Doped Borophane Nanosheets: A Multifunctional Platform for Reversible Hydrogen Storage and Metal-Free Hydrogen Transfer.

Small (Weinheim an der Bergstrasse, Germany)·2026
Same author

Characterizing nanoparticle size and composition using microfluidic Raman diffusion-ordered spectroscopy.

Analytical methods : advancing methods and applications·2025
Same author

Nephelometry as a simple tool to monitor the disassembly of polymeric nanoparticles.

Analytical methods : advancing methods and applications·2025
Same author

Silicone Loss During Histological Preparation of Breast Implant Tissue From Capsular Contracture, Quantified by Stimulated Raman Scattering Microscopy.

Journal of biophotonics·2024
Same author

A comparison of multivariate curve resolution with endmember extraction methods in hyperspectral Raman imaging.

Spectrochimica acta. Part A, Molecular and biomolecular spectroscopy·2024

Related Experiment Video

Updated: Feb 27, 2026

A Filter-based Surface Enhanced Raman Spectroscopic Assay for Rapid Detection of Chemical Contaminants
08:13

A Filter-based Surface Enhanced Raman Spectroscopic Assay for Rapid Detection of Chemical Contaminants

Published on: February 19, 2016

9.9K

Fast High-Resolution Screening Method for Reactive Surfaces by Combining Atomic Force Microscopy and Surface-Enhanced

Camiel H van Hoorn1, Carlos Wessels1, Freek Ariese1

  • 11 Faculty of Sciences and LaserLaB, VU University, Amsterdam, The Netherlands.

Applied Spectroscopy
|July 1, 2017
PubMed
Summary

This study introduces a rapid, high-resolution method combining Atomic Force Microscopy (AFM) and Surface-Enhanced Raman Spectroscopy (SERS) for analyzing reactive surfaces. The technique provides both morphological and chemical data efficiently, enabling detailed surface process investigation.

Keywords:
AFMRaman imagingSERSSurface-enhanced Raman spectroscopyatomic force miscroscopycatalysisp-NTPp-nitrothiophenol

More Related Videos

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope AFM-SECM
08:31

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope AFM-SECM

Published on: February 10, 2021

7.6K
Author Spotlight: Tracking Electrochemistry on Single Nanoparticles with Surface-Enhanced Raman Scattering Spectroscopy and Microscopy
10:59

Author Spotlight: Tracking Electrochemistry on Single Nanoparticles with Surface-Enhanced Raman Scattering Spectroscopy and Microscopy

Published on: May 12, 2023

3.5K

Related Experiment Videos

Last Updated: Feb 27, 2026

A Filter-based Surface Enhanced Raman Spectroscopic Assay for Rapid Detection of Chemical Contaminants
08:13

A Filter-based Surface Enhanced Raman Spectroscopic Assay for Rapid Detection of Chemical Contaminants

Published on: February 19, 2016

9.9K
Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope AFM-SECM
08:31

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope AFM-SECM

Published on: February 10, 2021

7.6K
Author Spotlight: Tracking Electrochemistry on Single Nanoparticles with Surface-Enhanced Raman Scattering Spectroscopy and Microscopy
10:59

Author Spotlight: Tracking Electrochemistry on Single Nanoparticles with Surface-Enhanced Raman Scattering Spectroscopy and Microscopy

Published on: May 12, 2023

3.5K

Area of Science:

  • Surface Science
  • Analytical Chemistry
  • Spectroscopy

Background:

  • Characterizing reactive surfaces requires methods providing both morphological and chemical information.
  • Existing techniques may lack the speed or resolution needed for dynamic surface processes.

Purpose of the Study:

  • To develop a fast, high-resolution screening method for reactive surfaces.
  • To integrate Atomic Force Microscopy (AFM) and Surface-Enhanced Raman Spectroscopy (SERS) for combined morphological and chemical analysis.
  • To enable efficient study of surface reactivity with minimal sample.

Main Methods:

  • Combined AFM and SERS using a substrate with an alignment pattern for image registration.
  • Fast AFM for morphological data acquisition.
  • Sub-micron resolution SERS scans (30 min/scan for 100x100 µm²).

Main Results:

  • Achieved simultaneous morphological and chemical mapping of reactive surfaces.
  • Demonstrated the method's capability by studying the photo-catalytic reduction of p-nitrothiophenol (p-NTP).
  • Obtained a complete reactivity overview within hours using a monolayer of reactant.

Conclusions:

  • The integrated AFM-SERS method offers a powerful tool for rapid, high-resolution surface analysis.
  • This technique is suitable for studying surface reactions and processes with high detail.
  • The approach provides a comprehensive understanding of surface chemical and physical properties.