Related Experiment Video
Updated: Feb 27, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Upgrade of a commercial four-probe scanning tunneling microscopy system
Ruisong Ma1, Qing Huan1, Liangmei Wu1
1Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China.
Abstract:
Upgrade of a commercial ultra-high vacuum four-probe scanning tunneling microscopy system for atomic resolution capability and thermal stability is reported. To improve the mechanical and thermal performance of the system, we introduced extra vibration isolation, magnetic damping, and double thermal shielding, and we redesigned the scanning structure and thermal links. The success of the upgrade is characterized by its atomically resolved imaging, steady cooling down cycles with high efficiency, and standard transport measurement capability. Our design may provide a feasible way for the upgrade of similar commercial systems.

