Probing the Morphology and Evolving Dynamics of 3D Printed Nanostructures Using High-Speed Atomic Force Microscopy

Area of Science:

• Materials Science
• Nanotechnology
• Surface Science

Background:

• Focused electron beam induced deposition (FEBID) is a key technique for fabricating 3D nanostructures.
• Current limitations include a lack of real-time morphological feedback, hindering precise control over nanostructure growth.
• Advancing fabrication precision requires in situ monitoring capabilities.

Purpose of the Study:

• To integrate in situ high-speed atomic force microscopy (HS-AFM) with FEBID for real-time morphological feedback.
• To enable simultaneous imaging and fabrication for investigating dynamic processes during nanostructure growth.
• To characterize the evolving mechanical properties of nanodeposits during the FEBID process.

Main Methods:

• Combined in situ high-speed atomic force microscopy (HS-AFM) with focused electron beam induced deposition (FEBID).
• Utilized simultaneous imaging and fabrication to monitor nanostructure growth in real-time.
• Performed mechanical property measurements during the deposition process.

Main Results:

• Achieved real-time morphological feedback during multistep FEBID fabrication.
• Demonstrated simultaneous imaging and fabrication capabilities.
• Observed an exponential increase in mechanical resistance over approximately 4 minutes, indicating the establishment of a stable mechanical state.

Conclusions:

• The integration of HS-AFM with FEBID enhances fabrication precision for 3D nanostructures.
• Simultaneous imaging and fabrication provide insights into the dynamic evolution of nanostructures.
• The study reveals a characteristic timescale for the development of mechanical stability in FEBID-grown materials.