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Updated: Feb 25, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Low noise current preamplifier for qPlus sensor deflection signal detection in atomic force microscopy at room and
Ferdinand Huber1, Franz J Giessibl1
1Institute of Experimental and Applied Physics, University of Regensburg, 93053 Regensburg, Germany.
Abstract:
The resolution of frequency modulation atomic force microscopy is limited by instrumental noise. When using a qPlus sensor, the deflection detector noise is the dominant noise contribution. It can be reduced by improving the preamplifier used to amplify the sensor deflection signal. We present a simple single-stage differential preamplifier which outperforms previous designs known to us by at least a factor of two in the deflection noise density. We show specific versions of this preamplifier to use in ambient conditions, in ultra-high vacuum at room temperature, and at 4.2 K. Furthermore, we compare the thermal peak analysis and the frequency shift noise density method as a means to determine the deflection noise density. We note that this preamplifier can also be used for any current-generating sensors such as other piezoelectric sensors and photodiodes, but, in this paper, we restrict our analysis to qPlus sensors.

