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Updated: Feb 25, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Meng Zhang1, Zhigang Liu1, Yu Zhu1
1Key Laboratory of Education Ministry for Modern Design and Rotor-Bearing System, Xi'an Jiaotong University, Xi'an 710049, China.
This study introduces a hybrid control system combining integral force feedback (IFF) and input shaping to enhance piezo-based scanning systems. The novel approach effectively eliminates hysteresis and reduces vibrations, enabling faster scanning speeds for lasers.
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