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Quantitative electric field mapping in thin specimens using a segmented detector: Revisiting the transfer function
Takehito Seki1, Gabriel Sánchez-Santolino1, Ryo Ishikawa1
1Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Yayoi 2-11-16, Bunkyo-ku, Tokyo 113-8656, Japan.
Abstract:
Differential phase contrast in scanning transmission electron microscopy can visualize local electromagnetic fields inside specimens. The contrast derived from first moments, the so-called center of mass, of the diffraction patterns for each probe position can be quantitatively related to the local electromagnetic field under the phase object approximation. While only approximate first moments can be obtained with a segmented detector, in weak phase objects the fields can be accurately quantified on the basis of a phase contrast transfer function. Through systematic image simulations we further show that the quantification based on the approximated first moment is a good approximation also for strong phase objects.

