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Dynamic Pore-scale Reservoir-condition Imaging of Reaction in Carbonates Using Synchrotron Fast Tomography

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MHz frame rate hard X-ray phase-contrast imaging using synchrotron radiation.

Margie P Olbinado, Xavier Just, Jean-Louis Gelet

|August 10, 2017

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High-speed X-ray phase-contrast imaging (XPCI) now captures transient processes at millions of frames per second. This breakthrough enables visualization of rapid phenomena like crack propagation and shock waves previously unobservable.

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Last Updated: Feb 25, 2026

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Area of Science:

Physics
Materials Science
Engineering

Background:

Third-generation synchrotron light sources provide high flux, coherence, and short pulses (~10^-10 s).
These properties enable hard X-ray phase-contrast imaging (XPCI) with single-bunch temporal resolution.

Purpose of the Study:

To demonstrate XPCI capable of millions of frames per second using MHz synchrotron X-ray pulse repetition rates.
To visualize aperiodic or stochastic transient processes at ultra-high speeds.

Main Methods:

Utilized MHz repetition rates of synchrotron X-ray pulses.
Employed indirect X-ray detection techniques.
Implemented multiple-frame recording for high-speed data acquisition.

Main Results:

Achieved XPCI with millions of frames per second recording capabilities.
Successfully visualized ultra-fast phenomena, including crack tip propagation in glass (km/s).
Observed shock wave propagation in water and electric arc ignition explosions (µm/ns).

Conclusions:

This advanced XPCI technique overcomes limitations of single-shot and stroboscopic methods.
Enables the study of transient dynamic processes previously inaccessible.
Opens new avenues for research in materials science, physics, and engineering.