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Light Enhanced Hydrofluoric Acid Passivation: A Sensitive Technique for Detecting Bulk Silicon Defects
Published on: January 4, 2016
C(sp3)-F, C(sp2)-F and C(sp3)-H bond activation at silicon(ii) centers
V S V S N Swamy1, Nasrina Parvin, K Vipin Raj
1Inorganic Chemistry and Catalysis Division, CSIR-National Chemical Laboratory, Dr. Homi Bhabha Road, Pashan, Pune 411008, India. ss.sen@ncl.res.in.
Abstract:
Silylene [PhC(NtBu)2SiN(SiMe3)2] (1) cleaves the C(sp3)-H and C-F bonds of acetophenone and 1,1,1-trifluoroacetophenone, respectively, under mild conditions. The reaction is initiated via a nucleophilic attack from the oxygen to the silicon atom followed by C-F/H bond cleavage. The scope of C-F bond activation has further been extended with C6F6 and C6F5CF3.
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