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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
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Micro-beam Laue alignment of multi-reflection Bragg coherent diffraction imaging measurements.
Felix Hofmann1, Nicholas W Phillips2, Ross J Harder3
1Department of Engineering Science, University of Oxford, Parks Road, Oxford OX2 7TL, United Kingdom.
Journal of Synchrotron Radiation
|September 2, 2017
Summary
This study introduces a faster method for 3D lattice strain tensor measurements in micro-crystals using X-ray diffraction. The new technique simplifies alignment, enabling rapid and reliable analysis even in distorted samples.
Area of Science:
- Materials Science
- Crystallography
- X-ray Physics
Background:
- Multi-reflection Bragg coherent diffraction imaging (BCDI) enables 3D lattice strain tensor measurements in micro-crystals.
- Previous BCDI methods required time-consuming manual alignment procedures, limiting their practical application.
Purpose of the Study:
- To develop a rapid and reliable method for 3D strain tensor measurements in micro-crystals.
- To overcome the limitations of laborious alignment in BCDI.
Main Methods:
- Utilized micro-beam Laue X-ray diffraction to determine micro-crystal lattice orientation.
- Employed lattice orientation data for rapid alignment of BCDI measurements from multiple reflections.
- Performed BCDI on a focused ion beam milled micro-crystal, collecting data from six reflections.
Main Results:
- Successfully determined 3D strain and stress fields in the micro-crystal.
- Demonstrated the feasibility of rapid alignment for BCDI using Laue diffraction orientation.
- Showcased the ability to assess phase retrieval reliability using data from more than three reflections.
Conclusions:
- A new approach enables rapid, reliable 3D coherent diffraction measurements of the full lattice strain tensor in micro-crystals.
- The method is effective even for heavily distorted samples.
- This advancement significantly enhances the accessibility and efficiency of BCDI for materials analysis.
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