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Updated: Feb 23, 2026

From Voxels to Knowledge: A Practical Guide to the Segmentation of Complex Electron Microscopy 3D-Data
Published on: August 13, 2014
Talita Perciano1, Daniela Ushizima1, Harinarayan Krishnan1
1Computational Research Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720-8150, USA.
This study introduces Materials Segmentation and Metrics (MSM), a new protocol for analyzing unsupervised classification in 3D micro-tomography (µ-CT) image segmentation. MSM offers tools and datasets to improve material design and quality control.
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