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32-channel time-correlated-single-photon-counting system for high-throughput lifetime imaging
P Peronio1, I Labanca1, G Acconcia1
1Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133 Milano, Italy.
The Review of Scientific Instruments
|September 3, 2017
Summary
This study presents an advanced multichannel Time-Correlated Single Photon Counting (TCSPC) system to overcome measurement time limitations in optical signal detection. The new system enhances performance for high-throughput fluorescence lifetime imaging microscopy.
Area of Science:
- Photonics and Optical Instrumentation
- Biophysics
- Microscopy
Background:
- Time-Correlated Single Photon Counting (TCSPC) is crucial for fast, weak optical signal measurement but suffers from long acquisition times.
- Existing multichannel TCSPC systems often face a performance trade-off with increasing channel parallelism.
- A previous 32-channel TCSPC system demonstrated overcoming this trade-off.
Purpose of the Study:
- To develop an advanced TCSPC system for high-throughput fluorescence lifetime imaging microscopy (FLIM).
- To overcome the performance limitations of existing multichannel TCSPC systems.
- To enable faster and more efficient FLIM acquisition.
Main Methods:
- Design and implementation of a novel hardware architecture for a multichannel TCSPC system.
- Development of centralized logic and fast data management firmware.
- Integration with a microscope for practical FLIM applications.
Main Results:
- The new system architecture successfully addresses the trade-off between parallelism and performance in TCSPC.
- Demonstrated feasibility for high-throughput FLIM applications.
- Preliminary results validate the system's performance and applicability.
Conclusions:
- The evolved multichannel TCSPC system offers a viable solution for high-throughput FLIM.
- The system's design overcomes previous performance limitations in parallel TCSPC.
- This technology advances optical signal measurement capabilities for advanced microscopy.
