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Magnetoelectric Force Microscopy on Antiferromagnetic 180∘ Domains in Cr₂O₃
Peggy Schoenherr1, L Marcela Giraldo2, Martin Lilienblum3
1Department of Materials, ETH Zurich, Vladimir-Prelog-Weg 4, 8093 Zürich, Switzerland. peggy.schoenherr@mat.ethz.ch.
Abstract:
Magnetoelectric force microscopy (MeFM) is characterized as methodical tool for the investigation of antiferromagnetic domain states, in particular of the 180 ∘ variety. As reference compound for this investigation we use Cr 2 O 3 . Access to the antiferromagnetic order is provided by the linear magnetoelectric effect. We resolve the opposite antiferromagnetic 180 ∘ domain states of Cr 2 O 3 and estimate the sensitivity of the MeFM approach, its inherent advantages in comparison to alternative techniques and its general feasibility for probing antiferromagnetic order.
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