Correlative Microscopy Combining Secondary Ion Mass Spectrometry and Electron Microscopy: Comparison of

Florian Vollnhals1, Jean-Nicolas Audinot1, Tom Wirtz1

  • 1Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Institute of Science and Technology (LIST) , 4422 Belvaux, Luxembourg.

Analytical Chemistry
|September 14, 2017
PubMed