Schottky Barrier Height of Pd/MoS₂ Contact by Large Area Photoemission Spectroscopy

MoS₂, as a model transition metal dichalcogenide, is viewed as a potential channel material in future nanoelectronic and optoelectronic devices. Minimizing the contact resistance of the metal/MoS₂ junction is critical to realizing the potential of MoS₂-based devices. In this work, the Schottky barrier height (SBH) and the band structure of high work function Pd metal on MoS₂ have been studied by in situ X-ray photoelectron spectroscopy (XPS). The analytical spot diameter of the XPS spectrometer is about 400 μm, and the XPS signal is proportional to the detection area, so the influence of defect-mediated parallel conduction paths on the SBH does not affect the measurement. The charge redistribution by Pd on MoS₂ is detected by XPS characterization, which gives insight into metal contact physics to MoS₂ and suggests that interface engineering is necessary to lower the contact resistance for the future generation electronic applications.