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X-ray Crystallography

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...

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Beam hardening correction in polychromatic x-ray grating interferometry.

Aimin Yan, Xizeng Wu, Hong Liu

|October 19, 2017

Summary

This summary is machine-generated.

Beam hardening causes fringe shift distortion in polychromatic X-ray grating interferometry. A new analytic method accurately retrieves monochromatic attenuation and phase shift from polychromatic data for precise electron density measurements.

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Area of Science:

Physics
Materials Science
Medical Imaging

Background:

Polychromatic X-ray grating interferometry is susceptible to fringe shift distortion.
Beam hardening is a primary cause of this distortion, complicating accurate measurements.
Existing methods struggle to fully correct for beam hardening effects.

Purpose of the Study:

To develop a novel analytic approach for correcting beam hardening distortions.
To accurately retrieve monochromatic attenuation and fringe phase shift from polychromatic X-ray measurements.
To enable precise electron density distribution measurements using X-ray grating interferometry.

Main Methods:

Developed a novel analytic approach based on the assumption of uniform energy dependence.
Applied the method to polychromatic X-ray grating interferometry measurements.
Validated the retrieval of monochromatic attenuation function and fringe phase shift.

Main Results:

Successfully retrieved the monochromatic attenuation function.
Accurately determined the fringe phase shift despite polychromatic beam hardening.
Demonstrated the method's efficacy in correcting for distortion.

Conclusions:

The novel analytic approach effectively corrects for beam hardening distortion.
This method provides a valuable tool for accurate electron density measurements.
Enhances the precision and reliability of X-ray grating interferometry applications.