Scan-less hyperspectral dual-comb single-pixel-imaging in both amplitude and phase

Area of Science:

• Optics and Photonics
• Spectroscopy
• Imaging Science

Background:

• Hyperspectral imaging provides rich spectral information for material characterization.
• Traditional methods often require mechanical scanning, limiting speed and resolution.
• Combining spectroscopic and imaging techniques is crucial for advanced material analysis.

Purpose of the Study:

• To develop a new hyperspectral imaging scheme.
• To achieve high-resolution amplitude and phase imaging without mechanical scanning.
• To demonstrate the scheme's capability in material thickness determination.

Main Methods:

• Developed a hybrid imaging scheme integrating dual-comb spectroscopy and Hadamard-transform-based single-pixel imaging.
• Acquired 12,000 hyperspectral images with 46 µm spatial resolution.
• Achieved spectral resolution of 20 MHz over a 1.2 THz range.

Main Results:

• Successfully obtained amplitude and phase hyperspectral images without mechanical scanning.
• Demonstrated the scheme by imaging a test chart through an etalon plate.
• Determined the thickness of a chromium-coated layer to be 70 nm using phase images.

Conclusions:

• The developed hyperspectral imaging scheme offers high spatial and spectral resolution without mechanical scanning.
• This technique is effective for precise material characterization and thickness measurement.
• The method shows promise for various applications in optics and material science.