Depth-resolved local reflectance spectra measurements in full-field optical coherence tomography

Full-field optical coherence tomography (FF-OCT) is a widely used technique for applications such as biological imaging, optical metrology, and materials characterization, providing structural and spectral information. By spectral analysis of the backscattered light, the technique of spectroscopic-OCT enables the differentiation of structures having different spectral properties, but not the determination of their reflectance spectrum. For surface measurements, this can be achieved by applying a Fourier transform to the interferometric signals and using an accurate calibration of the optical system. An extension of this method is reported for local spectroscopic characterization of transparent samples and in particular for the determination of depth-resolved reflectance spectra of buried interfaces. The correct functioning of the method is demonstrated by comparing the results with those obtained using a program based on electromagnetic matrix methods for stratified media. Experimental measurements of spatial resolutions are provided to demonstrate the smallest structures that can be characterized.