Super-resolution Fluorescence Microscopy
Total Internal Reflection Fluorescence Microscopy
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Sébastien Marbach1, Rémy Claveau2, Paul Montgomery2
1ICube, Université de Strasbourg, CNRS, INSA, 67000, Strasbourg, France. sebastien.marbach@etu.unistra.fr.
A novel microsphere-assisted nanoscope enhances white light interference microscopy for nanoscale material characterization. This technique improves lateral resolution for non-destructive, label-free local reflectance mapping.
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