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Simple autocorrelation method for thoroughly characterizing single-photon detectors.

Michael A Wayne, Joshua C Bienfang, Sergey V Polyakov

    Optics Express
    |October 19, 2017
    PubMed
    Summary
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    We developed a new method to precisely characterize single-photon detectors using multi-order correlations. This technique reveals a novel afterpulse effect in single-photon avalanche diodes during device reset.

    Area of Science:

    • Photonics and Quantum Optics
    • Detector Characterization
    • Solid-State Devices

    Background:

    • Accurate characterization of single-photon detectors is crucial for quantum technologies.
    • Existing methods can be complex and time-consuming.
    • Understanding detector behavior, including afterpulsing and reset dynamics, is essential.

    Purpose of the Study:

    • To introduce a simple, highly sensitive method for comprehensive single-photon detector characterization.
    • To analyze multi-order correlations of time-tagged detection events.
    • To investigate detector properties and identify novel operational effects.

    Main Methods:

    • Utilizing calibrated continuous-wave illumination.
    • Analyzing multi-order correlations of time-tagged detection events.

    Related Experiment Videos

  • Applying the method to single-photon avalanche diodes (SPADs).

    • Main Results:

    • Accurate measurement of first- and second-order properties (efficiency, dark count rate, dead time, reset behavior).
    • Characterization of higher-order properties, including afterpulse effects.
    • Discovery of a previously unreported afterpulse effect during SPAD reset.

    Conclusions:

    • The multi-order correlation method offers a powerful and efficient approach for detector characterization.
    • This technique provides deeper insights into detector physics, revealing subtle effects like reset-induced afterpulsing.
    • The findings advance the understanding and optimization of single-photon detector performance.