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Interference and Diffraction02:18

Interference and Diffraction

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Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
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There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...
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Related Experiment Video

Updated: Feb 20, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Development of a spatially dispersed short-coherence interferometry sensor using diffraction grating orders.

Mothana A Hassan

    Applied Optics
    |October 20, 2017
    PubMed
    Summary
    This summary is machine-generated.

    A new compact sensor uses short-coherence interferometry and a diffraction grating for faster surface profile measurements. This precision metrology system achieves high repeatability for quality control in modern manufacturing.

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    Area of Science:

    • Optical Engineering
    • Metrology
    • Manufacturing Technology

    Background:

    • Modern manufacturing demands rapid, high-precision quality control for increased throughput.
    • Existing metrology systems face challenges in achieving both speed and accuracy for process feedback.

    Purpose of the Study:

    • To present a novel, compact sensor configuration for high-speed surface profile measurement.
    • To enhance process-oriented precision metrology for manufacturing applications.

    Main Methods:

    • A spatially dispersed short-coherence interferometry sensor was developed.
    • A diffraction grating was utilized as a beam splitter/combiner, employing zeroth and first-order diffractions for reference and measurement arms.
    • The system was configured as a compact Michelson interferometer with reduced optical path length.

    Main Results:

    • The sensor effectively measures surface profiles with high repeatability.
    • Step-height repeatability was determined to be within the range of 27 nm to 22 nm across tested specimens.
    • The innovative design demonstrated its efficacy in precision metrology.

    Conclusions:

    • The developed sensor offers a compact and efficient solution for rapid surface profile measurement.
    • This technology supports advanced quality control in manufacturing by providing faster inspection and valuable feedback.
    • The use of diffraction orders in a Michelson interferometer configuration represents a significant advancement in precision metrology.