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Modified Gray-Level Coding Method for Absolute Phase Retrieval.

Xiangcheng Chen1, Shunping Chen2, Jie Luo3

  • 1School of Automation, Wuhan University of Technology, Wuhan 430070, China. chenxgcg@ustc.edu.

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Summary
This summary is machine-generated.

This study introduces a new gray-level coding method for accurate 3D shape measurements using fringe projection. The enhanced n-ary gray-level (nGL) patterns improve absolute phase retrieval, especially for complex surfaces.

Keywords:
fringe projectiongray-level codingphase retrievalphase shift

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Area of Science:

  • Optical Metrology
  • 3D Shape Measurement
  • Computer Vision

Background:

  • Fringe projection systems are crucial for 3D shape measurements.
  • Absolute phase retrieval remains a key challenge in these systems.
  • Existing methods like binary gray-level (bGL) have limitations.

Purpose of the Study:

  • To present a modified gray-level coding method for robust absolute phase retrieval.
  • To improve the accuracy and reliability of 3D shape measurements.
  • To address challenges posed by ambient light, surface contrast, and system defocus.

Main Methods:

  • Projection of two groups of fringe patterns: phase-shift patterns and n-ary gray-level (nGL) patterns.
  • Normalization of nGL pattern intensities using average intensity and modulation of phase-shift patterns.
  • Design of nGL patterns as n-ary gray-code (nGC) patterns to minimize codeword errors.

Main Results:

  • The nGL method generates more unique codewords than the bGL method.
  • Normalization effectively handles variations in ambient light and surface contrast.
  • nGC pattern design reduces codeword detection errors caused by defocus.
  • Experimental results demonstrate robustness and effectiveness for complex surfaces.

Conclusions:

  • The proposed modified nGL method enhances absolute phase retrieval accuracy.
  • This technique is effective for 3D shape measurement of isolated objects with complex surfaces.
  • The method offers improved robustness against common optical measurement errors.