Recent advances in edge illumination x-ray phase-contrast tomography

Area of Science:

• Medical Imaging
• Physics
• Materials Science

Background:

• Edge illumination (EI) is an X-ray phase-contrast imaging technique.
• It visualizes features not detectable by absorption-based radiography by exploiting X-ray refraction.
• EI is achromatic and does not require high spatial coherence, allowing use with synchrotron radiation and commercial X-ray tubes.

Purpose of the Study:

• To review recent advances in Edge Illumination Computed Tomography (EI CT).
• To summarize the development of EI CT, including acquisition schemes, retrieval approaches, and applications.
• To highlight EI CT's potential as a widespread imaging tool.

Main Methods:

• Utilizes X-ray refraction for enhanced contrast.
• Employs various retrieval algorithms to extract attenuation, refraction, and scattering information.
• Leverages a developed theoretical framework for 3D imaging via EI CT.

Main Results:

• EI CT provides 3D imaging capabilities.
• Information on attenuation, refraction, and scattering properties can be obtained.
• The technique is adaptable to different X-ray sources.

Conclusions:

• Recent theoretical and practical developments are transforming EI CT into a versatile imaging tool.
• EI CT offers significant advantages over conventional radiography for specific applications.
• Further development promises broader adoption across various scientific and industrial fields.