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Quick pre-correction of a grating fringe for phase measuring profilometry.
Applied Optics
|November 2, 2017
Summary
A new pre-correction method for phase measuring profilometry (PMP) systems quickly corrects grating fringe distortions like keystone and period broadening without special targets. This analytic spatial transform method enhances accuracy in real-world engineering conditions.
Area of Science:
- Optical Metrology
- 3D Reconstruction
- Image Processing
Background:
- Phase Measuring Profilometry (PMP) systems using digital light projectors often face geometric distortions (keystone, period broadening) in real-world applications.
- Traditional calibration methods struggle to fully eliminate these grating fringe distortions on the reference plane.
- System geometry limitations are often impractical in actual engineering conditions, necessitating robust correction techniques.
Purpose of the Study:
- To propose a novel, quick pre-correction method for grating fringes in digital light projector-based PMP systems.
- To address and individually correct keystone and period broadening distortions that are difficult to eliminate traditionally.
- To develop a correction method compatible with existing PMP calibration techniques and applicable without special targets.
Main Methods:
- An analytic spatial transform-based pre-correction method is designed.
- The correction is applied before generating the digital micromirror device image.
- The method involves projecting and capturing a fringe pattern and a corner pattern for rapid calibration.
Main Results:
- The proposed method effectively corrects keystone and period broadening distortions in grating fringes.
- Simulations and experiments confirm the method's effectiveness.
- The correction process is quick, completed within seconds, and requires no special calibration target.
Conclusions:
- The novel grating fringe pre-correction method offers a practical solution for PMP systems operating under non-ideal geometric conditions.
- This analytic spatial transform approach enhances the accuracy and applicability of PMP in engineering.
- The method's simplicity, speed, and compatibility make it a valuable advancement in optical metrology.

