Imaging with ultra-small-angle X-ray scattering using a Laue-case analyzer and its application to human breast tumors

In this study, we demonstrate a novel imaging technique, based on ultra-small-angle X-ray scattering (USAXS) that uses a Laue-case Si wafer as the angle analyzer.

We utilized the (1 1 1) diffraction plane of a 356 μm thick, symmetrically cut Si wafer as the angle analyzer, denoted by A[L]. With this device, we performed USAXS imaging experiments using 19.8 keV synchrotron X-rays. The objects we imaged were formalin-fixed, paraffin-embedded breast tumors (an invasive carcinoma and an intraductal papilloma). During image acquisition by a charge-coupled device (CCD) camera, we varied the rotation angle of the analyzer in 0.02″ steps from -2.40″ to +2.40″ around the Bragg angle. The exposure time for each image was 2 s. We determined the amount of ultra-small-angle X-ray scattering from the width of the intensity curve obtained for each local pixel during the rotation of the analyzer.

We acquired USAXS images of malignant and benign breast tumor specimens using the A[L] analyzer; regions with larger USAXS form brighter areas in the image. We varied the sensitivity of the USAXS image by changing the threshold level of the object rocking curve.

The USAXS images can provide information about the internal distribution of closely packed scattering bodies in a sample with reasonable sensitivity. This information differs from that obtainable through refraction-contrast imaging. Although further validation studies will be necessary, we conclude that USAXS imaging using a Laue-case analyzer may have significant potential as a new diagnosis technique.