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Updated: Feb 18, 2026

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Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies
Published on: December 18, 2015
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Conference Report: METROLOGY ISSUES IN TERAHERTZ PHYSICS AND TECHNOLOGY Gaithersburg, MD December 13, 1994 Report
Raju Datla1, Erich Grossman2, Mitchell K Hobish3
1National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
Abstract
No abstract available in PubMed .

