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Single-shot structural analysis by high-energy X-ray diffraction using an ultrashort all-optical source.

R Rakowski1, G Golovin1, J O'Neal1

  • 1Department of Physics and Astronomy, University of Nebraska-Lincoln, Lincoln, Nebraska, 68588, USA.

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|December 2, 2017
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Summary
This summary is machine-generated.

Researchers demonstrate ultrafast single-crystal diffraction using high-energy X-rays (HEX-rays). This breakthrough enables direct imaging of atomic dynamics with femtosecond precision, overcoming previous source limitations.

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Photon Science

Background:

  • High-energy X-rays (HEX-rays) offer unique properties like low absorption and high resolution.
  • Ultrafast X-ray diffraction is crucial for imaging atomic dynamics but limited by femtosecond HEX-ray source availability.

Purpose of the Study:

  • To demonstrate single-crystal diffraction using ultrashort femtosecond HEX-ray pulses.
  • To develop a method for measuring crystal lattice spacing with limited photon counts.

Main Methods:

  • Generation of ultrashort ~90 keV HEX-ray pulses via an all-optical inverse Compton scattering source.
  • Single-crystal diffraction experiments using a cylindrically bent Germanium (Ge) crystal in Laue transmission geometry.
  • Development of a single-shot method for measuring crystal lattice spacing.

Main Results:

  • Successful single-crystal diffraction achieved with ultrashort ~90 keV HEX-ray pulses.
  • A method was demonstrated to measure crystal lattice spacing using approximately 10^5 photons.
  • Structural information was obtained across the full X-ray spectrum.

Conclusions:

  • This work overcomes limitations in generating femtosecond HEX-ray pulses for ultrafast studies.
  • It represents a significant step towards real-time atomic dynamics measurements using femtosecond HEX-rays.
  • The developed method enables efficient structural analysis with limited photon budgets.