A high precision flat crystal spectrometer compatible for ultra-high vacuum light source

Area of Science:

• Atomic Physics
• X-ray Spectroscopy
• Plasma Physics

Background:

• Early flat crystal spectrometers (FCS) suffered from oil contamination and limited detector-to-crystal distance.
• These limitations hindered precise X-ray spectral analysis and source characterization.

Purpose of the Study:

• To develop an improved FCS addressing previous design limitations.
• To enhance spectral resolution and measurement capabilities for X-ray sources.

Main Methods:

• A novel FCS design incorporating a differentially pumped rotary feedthrough and extendable bellows.
• Utilized double detectors for Bond method and double-crystal measurements.
• Performed off-line tests with titanium Kα X-rays and on-line measurements with He-like argon ions at Shanghai EBIT.

Main Results:

• Achieved a vacuum better than 6 × 10^-10 Torr, compatible with ultra-high vacuum light sources.
• Measured spectral line broadening of 0.869 eV, yielding a resolving power of 3600.
• Simulations predicted a nominal resolving power of 6500 due to an increased crystal-to-detector distance.

Conclusions:

• The new FCS design successfully overcomes previous limitations, offering superior performance.
• The enhanced resolving power enables more accurate characterization of X-ray sources and spectral analysis.
• This advanced spectrometer is suitable for direct coupling with ultra-high vacuum light sources for detailed plasma diagnostics.