Scanning Electron Microscopy
Electron Microscope Tomography and Single-particle Reconstruction
Preparation of Samples for Electron Microscopy
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Updated: Feb 17, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Timothy J Ruggles1, Geoffrey F Bomarito2, Andrew H Cannon3
11National Institute of Aerospace,Hampton,VA,USA.
A novel urethane microstamp enables in situ correlative microscopy by creating a Digital Image Correlation (DIC) pattern compatible with Scanning Electron Microscopy (SEM) and Electron Backscatter Diffraction (EBSD) analysis.
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