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Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
Published on: April 24, 2018
B R Pauw1, A J Smith2, T Snow2
1Bundesanstalt für Materialforschung und -prüfung (BAM), 12205 Berlin, Germany.
This study presents a straightforward data correction method for small-angle X-ray scattering (SAXS) experiments. Applying these steps ensures accurate absolute scattering cross-section values with uncertainty estimates.
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