An Improved Pathological Brain Detection System Based on Two-Dimensional PCA and Evolutionary Extreme Learning

Deepak Ranjan Nayak1, Ratnakar Dash2, Banshidhar Majhi2

  • 1Pattern Recognition Lab, Department of Computer Science and Engineering, National Institute of Technology, Rourkela, 769 008, India. depakranjannayak@gmail.com.

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