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Nanometer-precise optical length measurement using near-field scanning optical microscopy with sharpened single

Takehiro Tachizaki1, Toshihiko Nakata2, Kaifeng Zhang2

  • 1Department of Optics and Imaging Science and Technology, Tokai University, 4-1-1 Kitakaname, Hiratsuka, 259-1292, Japan.

Ultramicroscopy
|December 16, 2017
PubMed

Keywords:
Carbon nanotubeNear-field scanning optical microscopyPrecise length measurement

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