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Tuning Oxide Properties by Oxygen Vacancy Control During Growth and Annealing
Published on: June 9, 2023
Oxygen Vacancy Dynamics at Room Temperature in Oxide Heterostructures
Shanyong Bao1, Jing Ma1, Teng Yang1
1State Key Lab of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University , Beijing 100084, P. R. China.
Researchers explored oxygen vacancy dynamics in complex oxides at room temperature using ion liquid gating. They observed reversible, nonvolatile resistive switching in PrBaCo2O5+δ/Gd2O3-doped CeO2 heterostructures.
Area of Science:
- Materials Science
- Solid-State Chemistry
- Oxide Electronics
Background:
- Oxygen vacancies significantly influence the properties of complex oxides.
- Understanding oxygen dynamics is crucial for developing advanced electronic devices.
- Room temperature operation is highly desirable for practical applications.
Purpose of the Study:
- To investigate the dynamic behavior of oxygen vacancies at room temperature in complex oxide heterostructures.
- To explore the influence of ion liquid gating on oxygen redox dynamics.
- To demonstrate reversible and nonvolatile resistive switching.
Main Methods:
- Fabrication of PrBaCo2O5+δ/Gd2O3-doped CeO2 epitaxial thin film heterostructures on Y2O3-stabilized ZrO2 substrates.
- Utilized ion liquid gating technique combined with in situ resistance measurements.
- Applied gating voltage and varied pulse durations to probe oxygen dynamics.
Main Results:
- Precisely detected oxygen dynamic changes in response to gating voltage and duration.
- Observed a reversible and nonvolatile resistive switching phenomenon.
- Achieved resistive switching at room temperature with a gating voltage >13.5 V and pulse duration >1 s.
Conclusions:
- Demonstrated the feasibility of controlling oxygen vacancy dynamics at room temperature using ion liquid gating.
- The observed resistive switching behavior offers potential for novel memory and neuromorphic computing applications.
- Highlights the importance of PrBaCo2O5+δ/Gd2O3-doped CeO2 heterostructures for future oxide electronics.
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