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Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra.
David M Surmick1,2, Hacene Boukari2, Jonathan Woodward3
11 14710 University of Massachusetts Lowell, Lowell, MA, USA.
A new method quantifies uncertainty in multi-peaked emission spectra without assuming line profiles. This approach decomposes total uncertainty to determine individual peak contributions, enhancing spectral analysis.
Area of Science:
- Spectroscopy
- Analytical Chemistry
- Data Analysis
Background:
- Accurate quantification of emission lines is crucial for spectral analysis.
- Existing methods for uncertainty determination often rely on assumptions about line profiles.
- Multi-peaked spectra present challenges in isolating and quantifying individual emission lines.
Purpose of the Study:
- To present a novel method for determining the total uncertainty in integrated intensity of fitted emission lines in multi-peaked spectra.
- To develop a method that does not require prior assumptions on line profile types.
- To enable accurate decomposition of uncertainty for individual peaks within multiline fits.
Main Methods:
- Calculating total uncertainty as the absolute difference between a fitted and measured spectrum.
- Decomposing the total uncertainty into contributions from individual peaks.
- Utilizing a tabulated weighting factor to represent each peak's contribution to total uncertainty.
Main Results:
- A robust method for uncertainty determination in multi-peaked emission spectra was developed.
- The method successfully decomposes total uncertainty without line profile assumptions.
- Weighting factors effectively quantify individual peak contributions to overall spectral uncertainty.
Conclusions:
- The presented method offers a significant advancement in quantifying spectral uncertainty.
- This technique improves the reliability of quantitative analysis in multi-peaked emission spectra.
- Applications in laser-induced breakdown spectroscopy (LIBS) analysis are demonstrated for enhanced accuracy.
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