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Ultrahigh-resolution and wideband optical vector analysis for arbitrary responses.

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    Area of Science:

    • Photonics
    • Optical Engineering
    • Metrology

    Background:

    • Accurate characterization of optical systems is crucial for performance evaluation.
    • Existing optical vector analyzers often require complex architectures or optical filtering.
    • Wideband and high-resolution measurements are essential for advanced optical processing.

    Purpose of the Study:

    • To propose and demonstrate a novel, ultrahigh-resolution, and wideband optical vector analyzer (OVA).
    • To achieve a simplified architecture for optical system characterization.
    • To enable measurement of arbitrary optical responses with high precision.

    Main Methods:

    • Utilizing chirped optical double-sideband (ODSB) modulation in a single-drive Mach-Zehnder modulator (MZM).
    • Implementing a two-step measurement by biasing the MZM at two distinct points to differentiate sideband information.
    • Operating without the need for optical filtering, allowing flexible carrier wavelength placement.

    Main Results:

    • Demonstrated an ultrahigh-resolution (1.12 MHz) and wideband (134 GHz) OVA.
    • Successfully measured magnitude and phase responses of a programmable optical processor with various responses (bandpass, notch, falling-edge).
    • Achieved a simplified OVA architecture with high measurement accuracy.

    Conclusions:

    • The proposed ODSB-based OVA offers a simplified and versatile solution for optical system characterization.
    • The technique provides ultrahigh resolution and wideband measurement capabilities suitable for complex optical responses.
    • This approach advances optical metrology by enabling precise analysis of arbitrary optical functions.