Scanning Electron Microscopy
Leaky Scanning
Substitution Rule Applied to Indefinite Integrals
Substitution Rule Applied to Definite Integrals
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Microwave Assisted Rapid Diagnosis of Plant Virus Diseases by Transmission Electron Microscopy
Published on: October 14, 2011
Arne Buchter1, Johannes Hoffmann1, Alexandra Delvallée2
1Federal Institute of Metrology METAS, Lindenweg 50, 3003 Bern-Wabern, Switzerland.
A new calibration algorithm for scanning microwave microscopes (SMMs) accurately measures carrier densities in semiconductors. This versatile method is independent of instrument and frequency, validated up to 27.5 GHz.
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