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Microwave Assisted Rapid Diagnosis of Plant Virus Diseases by Transmission Electron Microscopy
Published on: October 14, 2011
High quality ultrafast transmission electron microscopy using resonant microwave cavities
W Verhoeven1, J F M van Rens1, E R Kieft2
1Department of Applied Physics, Coherence and Quantum Technology Group, Eindhoven University of Technology, P.O. Box 513, 5600, MB Eindhoven, Netherlands.
Abstract:
Ultrashort, low-emittance electron pulses can be created at a high repetition rate by using a TM110 deflection cavity to sweep a continuous beam across an aperture. These pulses can be used for time-resolved electron microscopy with atomic spatial and temporal resolution at relatively large average currents. In order to demonstrate this, a cavity has been inserted in a transmission electron microscope, and picosecond pulses have been created. No significant increase of either emittance or energy spread has been measured for these pulses. At a peak current of 814 ± 2 pA, the root-mean-square transverse normalized emittance of the electron pulses is ɛn,x=(2.7±0.1)·10-12 m rad in the direction parallel to the streak of the cavity, and ɛn,y=(2.5±0.1)·10-12 m rad in the perpendicular direction for pulses with a pulse length of 1.1-1.3 ps. Under the same conditions, the emittance of the continuous beam is ɛn,x=ɛn,y=(2.5±0.1)·10-12 m rad. Furthermore, for both the pulsed and the continuous beam a full width at half maximum energy spread of 0.95 ± 0.05 eV has been measured.
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