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Updated: Feb 12, 2026

Fabrication of a Dipole-assisted Solid Phase Extraction Microchip for Trace Metal Analysis in Water Samples
Published on: August 7, 2016
Insights on limits of detection, precision and accuracy in TXRF analysis of trace and major elements in environmental
Fernando Rodolfo Espinoza-Quiñones1, Aparecido Nivaldo Módenes1, Joelmir Dos Santos1
1Department of Chemical Engineering, Postgraduate Program, West Parana State University, Campus of Toledo, rua da Faculdade 645, Jd. Santa Maria, 85903-000 Toledo, PR, Brazil.
Abstract:
In this work, the analytical capability of the total reflection X-ray fluorescence technique with the S2 PICOFOX spectrometer was investigated. A set of certified reference materials was prepared as solid particulate for TXRF analysis. Experimental data of sensitivity, limits of detection and recovery for many elements were obtained. Good sensitivity and limits of detection with a good recovery range of around 90-110% were achieved. Thus, the TXRF technique exhibits a good analytical potential for its applicability on different materials.
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